Owing to the incessant demand for reductions in the size of portable electronics, new dense packaging technologies are required. Reflow soldering is still mainly used for component joining on the substrate. In tiny joints such as those in flip chip (FC) assemblies the flux effect is vitally important and needs to pass a narrower performance window than in ordinary surface mount technology (SMT). The determination of the suitability of a flux, as reported in this paper, is twofold; first, the flux must perform well in its intended purpose and second, the flux must not leave harmful residues causing leakage or electromigration. The first test used was the wetting balance test for all fluxes. Fluxes accepted on the basis of the wetting tests were then subjected to the surface insulation resistance test (SIR).
Article navigation
1 April 1999
Review Article|
April 01 1999
Qualification of flip chip fluxes by wetting balance and surface insulation resistance tests Available to Purchase
Aulis Tuominen;
Aulis Tuominen
Tampere University of Technology, and Nokia Research Center, Pori, Finland
Search for other works by this author on:
Eero Ristolainen;
Eero Ristolainen
Tampere University of Technology, Pori, Finland
Search for other works by this author on:
Ville Lehtinen
Ville Lehtinen
Nokia Research Center, Pori, Finland
Search for other works by this author on:
Publisher: Emerald Publishing
Online ISSN: 1758-6836
Print ISSN: 0954-0911
© MCB UP Limited
1999
Soldering & Surface Mount Technology (1999) 11 (1): 21–26.
Citation
Tuominen A, Ristolainen E, Lehtinen V (1999), "Qualification of flip chip fluxes by wetting balance and surface insulation resistance tests". Soldering & Surface Mount Technology, Vol. 11 No. 1 pp. 21–26, doi: https://doi.org/10.1108/09540919910254651
Download citation file:
Suggested Reading
Surface insulation resistance (SIR) response to various processing parameters
Soldering & Surface Mount Technology (August,1999)
The impact of temperature and humidity conditions on surface insulation resistance values for various fluxes
Soldering & Surface Mount Technology (April,1999)
Evaluation of pre‐deposited (no‐flow) underfill for flip chip and CSP assembly
Soldering & Surface Mount Technology (April,1999)
The Correlation between Short‐ and Long‐term SIR Testing
Circuit World (August,1996)
Testing for the synergistic compatibility of process chemistries using surface insulation resistance measurements
Circuit World (December,1999)
Recommended for you
These recommendations are informed by your reading behaviors and indicated interests.
