This paper presents results on adding silane coupling agents to the underfill encapsulant to enhance the rheology and wetting of the underfill. These results include rheology measurements, contact angle measurements, and in situ flows using a simulated test chip on an FR4 with solder mask substrate. Three properties of the underfill encapsulant that can affect the mechanical reliability of the die and substrate assembly are: CTE; elastic modulus; and adhesion to the die and substrate surfaces. The approach taken in this paper is to add silane coupling agents with different chemistries to the underfill encapsulant to provide interfacial coupling of the underfill material to different die and substrate materials. This paper presents results on the enhancement of the adhesion of underfill encapsulant to silicon (Si), silicon nitride (SiN) die passivation, benzocyclobutene (BCB) die passivation, and solder mask surfaces. The adhesion strength was measured by die shear testing.
Article navigation
1 December 1999
Technical Paper|
December 01 1999
Enhancement of underfill encapsulants for flip‐chip technology Available to Purchase
M.B. Vincent;
M.B. Vincent
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA
Search for other works by this author on:
C.P. Wong
C.P. Wong
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA
Search for other works by this author on:
Publisher: Emerald Publishing
Online ISSN: 1758-6836
Print ISSN: 0954-0911
© MCB UP Limited
1999
Soldering & Surface Mount Technology (1999) 11 (3): 33–39.
Citation
Vincent M, Wong C (1999), "Enhancement of underfill encapsulants for flip‐chip technology". Soldering & Surface Mount Technology, Vol. 11 No. 3 pp. 33–39, doi: https://doi.org/10.1108/09540919910293856
Download citation file:
Suggested Reading
The investigation of the capillary flow of underfill materials
Microelectronics International (April,2002)
Evaluation of pre‐deposited (no‐flow) underfill for flip chip and CSP assembly
Soldering & Surface Mount Technology (April,1999)
Towards a better understanding of underfill encapsulation for flip chip technology: proposed developments for the future
Microelectronics International (August,1999)
Reliability of flip chips on FR‐4 assembled with reduced process steps
Circuit World (September,2001)
No flow underfill: additional reliability and failure mode analysis
Microelectronics International (August,2002)
Related Chapters
VARIATION OF CONCRETE BASE'S CLEANING GRADE AND ESTIMATION OF PROTECTIVE COATINGS
Challenges of Concrete Construction: Volume 6, Concrete for Extreme Conditions: Proceedings of the International Conference held at the University of Dundee, Scotland, UK on 9–11 September 2002
HOW POLYMERS IMPROVE CONCRETE FLOORS - POSSIBILITIES TODAY AND PROSPECTS FOR THE FUTURE
Concrete Floors And Slabs: Proceedings of the International Seminar held at the University of Dundee, Scotland, UK on 5–6 September 2002
Recommended for you
These recommendations are informed by your reading behaviors and indicated interests.
