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Xuexia Yang
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Journal Articles
Reliability analysis of TSV silicon perforated structures under thermal cyclic loading
Available to Purchase
Journal:
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology (2026) 38 (1): 50–60.
Published: 02 September 2025
Journal Articles
Reliability analysis based on modeling of POP packages under thermal-drop impact loads
Available to Purchase
Journal:
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology (2025) 37 (5): 386–396.
Published: 24 June 2025
Journal Articles
Reliability analysis and parameter optimisation of board-level BGA packaging structures under thermal-drop impact load
Available to Purchase
Journal:
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology (2025) 37 (4): 308–319.
Published: 02 April 2025
