An alternative to the Weibull step‐stress model

An alternative is proposed to the Weibull cumulative exposure model in step‐stress testing, that we call the transformed exponential model. The proposed model comes from a natural transformation of the exponential cumulative exposure model. It is as flexible as the cumulative exposure model for describing data, but its mathematical form makes it easier to obtain parameter estimates and standard errors. Inferential procedures and optimum designs are discussed for two‐step accelerated test plans with known shape parameter.