Issues

Appointments

Innos appoints Professor William J. Stewart (FREng) as chairman of the board

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Book review

Survival for a Small Planet

Brian Ellis
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Screen‐printed sensors with graphite electrodes – comparison of properties and physical method of sensitivity enhancement

Jan Krejčí; Jan Prášek; Lukáš Fujcik; Sameh Khatib; Edita Hejátková; Luboš Jakubka; Louisa Giannoudi
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Thermal strain analysis of IC packages using various Moiré methods

Z.W. Zhong
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Investigation of the fabrication parameters of thick film titanium oxide‐PVC pH electrodes using experimental designs

A. Gac; J.K. Atkinson; Z. Zhang; C.J. Sexton; S.M. Lewis; C.P. Please; Russell Sion
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A review of low‐power wireless sensor microsystems for biomedical capsule diagnosis

K. Arshak; E. Jafer; G. Lyons; D. Morris; O. Korostynska
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Thermal investigations of microelectronic chip with non‐uniform power distribution: temperature prediction and thermal placement design optimization

Teck Joo Goh; K.N. Seetharamu; G.A. Quadir; Z.A. Zainal; K. Jeevan Ganeshamoorthy
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Exhibitions and conferences

ElectronicaChina and ProductronicaChina

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Industry news

DuPont EKC Technology CMP slurry business transfers to DuPont AirProducts NanoMaterials L.L.C

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Cypress selects Camtek's Falcon Systems for automated optical wafer inspection

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Patentability of computer-implemented inventions

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IEE warns on long-term competitiveness

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Optical polymer fibres bring broadband multimedia into the home

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Electronic tags are a radio frequency away

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Hitachi high-technologies backs a winner

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Innos Ltd launches research and development operations for innovations in Silicon Technology

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EPCOS extends distribution agreement with Anglia

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Grant for research and development

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International diary

International diary

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Internet commentary

Small is beautiful

Brian Ellis
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New products

Inseto introduce TPTs – new low cost wire bonders

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New 2D/3D X-ray inspection system with digital imaging capability

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NSF launches BGE 27 encoder, with magnetic indexing

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New DYMAX non-yellowing LED encapsulants

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EPCOS CeraDiodes combine ESO protection with filtering

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Fastest Nexus debugging for deeply embedded systems and SoC

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New hall effect sensors from Hamlin

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